Academic Areas: photonic integrated circuits, neuromorphic chips, bio-/meta-/2D/1D materials for advanced photoelectronic devices, mobile health devices, and nanoscale metrology.
Jinlong Zhu received his BS degree in Mechanical Engineering from Huazhong university of Science and Technology in 2010, and earned his PhD in Mechatronic Engineering from Huazhong university of Science and Technology in 2015. From 2004 to 2001, he worked as postdoctoral researcher at the University of Illinois at Urbana-Champaign until he started his appointment of Professor with Huazhong University of Science and Technology in 2020. He conducts research in basic science and engineering at the intersection of optical physics, nanodevices, semiconductor IC chips in industrial robots, and machine learning. He is particularly interested in the application of tools, knowledge and insights from photonics, nanoscience and machine learning to the design of photoelectronic integrated systems for the noninvasive exploration of nanoworld.
2006.6 – 2010.6 Huazhong university of Science and Technology (HUST) Bachelor
2010.9 – 2015.6 Huazhong university of Science and Technology (HUST) Ph.D
Postdoctoral researcher (2015 - 2020), University of Illinois at Urbana-Champaign, USA
1. J. Zhu, U. Aditi, and L. L. Goddard. “Visualizable detection of nanoscale objects using anti-symmetric excitation and non-resonance amplification,” Nature Communications 11 (2020), 2754.
2. J. Zhu, L. Zhang, K. L. Wilke, X. Li, E. N. Wang, and L. L. Goddard. “Quasi-Newtonian Scanning Electron Microscopy (QN-SEM) for Monitoring Material Dynamics in High-Pressure Gaseous Environments,” Advanced Science 7, 2001268 (2020).
3. J. Zhu, Y. Liu, X. Yu, R. Zhou, J. Jin, and L. L. Goddard, “Sensing sub-10-nm wide perturbations in background nanopatterns using optical pseudo electrodynamics microscopy (OPEM),” Nano Letters 19 (2019), 5347-5355.
4. J. Zhu and L. L. Goddard, “All-dielectric concentration of electromagnetic fields at the nanoscale: the role of photonic nanojets,” Nanoscale Advances 1 (2019), 4615-4643.
5. L. Zhang, J. Zhu*, K. L. Wilke, Z. Xu, L. Zhao, Z. Lu, L. L. Goddard, and E. N. Wang, “Enhanced environmental scanning electron microscopy using phase reconstruction and its application in condensation,” ACS Nano 13 (2019), 1953-1960.
6. J. Zhu, R. Zhou, L. Zhang, B. Ge, C. Luo, and L. L. Goddard. “Regularized pseudo-phase imaging for inspecting and sensing nanoscale features,” Optics Express 27 (2019), 6719-6733.
7. J. Zhu and L. L. Goddard. “Controlling photonic nanojets: from the standpoint of eigenmodes,” IEEE Photonics Technology Letters 30 (2017), 75-78.
8. J. Zhu and L. L. Goddard. “Spatial control of photonic nanojets,” Optics Express 24 (2016), 30444-30464.
9. J. Zhu, S. Liu, H. Jiang, C. Zhang and X. Chen. “Improved deep-etched multilayer grating reconstruction by considering etching anisotropy and abnormal errors in optical scatterometry,” Optics Letters 40 (2015), 471-474.
10. J. Zhu, S. Y. Liu, X. Chen, C. Zhang and H. Jiang. “Robust solution to the inverse problem in optical scatterometry,” Optics Express 22 (2014), 22031-22042.
Awards and Honors
1. Finalist for the Tingye Li Award
2. MNTL Fellowship
1. Cisco Systems Inc., Machine Learning for Engineering Design and Analysis using Multi-GPU Nodes on Cisco UCS, 2015.07-2020.07.
2. Foxconn Inc., Smart Metrology for Miniature Lens and Lens Assembly, 2019.10-2022.10.
3. National Science Foundation (USA), Volumetric Optical Integrated Circuit Elements (VOICE), 2019.09-2022.08.
4. Strategic Research Initiative of Illinois, Massively Parallel Microscopes (MPMs) for investigating cells and semiconductor wafers, 2018.07-2019.07.
5. Zhejiang University – University of Illinois at Urbana-Champaign (ZJUI) Institute Research Program, Optical Mapping of the Dynamics of Cell Life-Cycle Evolution using a Photo-Electro-Thermo-Force Integrated Polarimetry (PETFIP) System, 2018.05-2019.05.
6. Strategic Research Initiative of Illinois, Realizing FOCI (Focusing Optical Concentrators that are Integrated), 2017.05-2018.05.
7. Nvidia Inc., Semiconductor Wafer Defect Inspection at the 5nm Technology Node and Beyond Using GPU-Accelerated Optical Microscopy & Nanoscopy, 2018.03-2019.03.