From Mar. 19 to 24 2016, Professor Shiyuan Liu and Associate Professor Hao Jiang went to Las Vegas, USA, to attend the SPIE 2016 International Symposium on Intelligent Structure and Non-Destructive Testing. In the Sysmposium, Dr. Hao Jiang gave an oral presentation named “Mueller matrix ellipsometry: a powerful tool for nondestructive characterization of nanostructure ”.
In his presentation, Dr. Jiang systematically presented the research works of NOM on the basic theory of nanostructure computational metrology, the development of high-precision broadband Mueller matrix ellipsometer, and the exploration of the Mueller matrix ellipsometer applications in nanostructure measurement. He pointed out that the ellipsometric scatterometry is particularly suitable for non-destructive, in-line and accurate measurement in the large-area-scale nanostructures manufacturing process. Combining with the introduction of current research topics of NOM, Dr. Jiang gave a prospect on the development of nanometer metrology in the future. The presentation attracted wide attention and interests of the participants.
The SPIE International Symposium on Intelligent Structure and Non-Destructive Testing, which is organized by the International society for Optics and Photonics, covering multiple research areas such as materials science, enabling technology, designment and manufacture of sensors/actuators, mems, nems, micro/nano and biological electronic equipment, bionic manufacturing, signal processing and control, wireless sensors and modeling/simulation/application of sensor network, etc. attracted thousands of experts, scholars and researchers around the world. During the symposium, Prof. Liu and Dr. Jiang made extensive exchanges with the participants.
After the symposium, invited by Prof. Peifeng Hsu, the vice president of Florida Institute of Technology, Prof. Liu and Dr. Jiang visited the Florida Institute of Technology from Mar. 24 to 29. Dr. Jiang gave a presentation at Florida Tech. During the visit, Prof. Liu and Dr. Jiang made friendly exchanges about possible cooperations with Prof. Hsu and Prof. Daniel Kirk, the associate dean of College of Engineering at Florida Institute of Technology. Prof. Kirk Daniel gladly accepted the invitation given by Prof. Liu and Dr. Jiang, and will visit HUST in August for further discussion on cooperation.
The visit was supported by the international cooperation promoting program funds of MSE.
